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HS-82C54RH
August 1995
Radiation Hardened CMOS Programmable Interval Timer
Pinouts
24 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T24 TOP VIEW
D7 1 D6 2 D5 3 D4 4 D3 5 D2 6 D1 7 D0 8 CLK 0 9 OUT 0 10 GATE 0 11 GND 12 24 VDD 23 WR 22 RD 21 CS 20 A1 19 A0 18 CLK 2 17 OUT 2 16 GATE 2 15 CLK 1 14 GATE 1 13 OUT 1
Features
* Radiation Hardened - Total Dose > 105 RAD (Si) - Transient Upset > 108 RAD (Si)/sec - Latch Up Free EPI-CMOS - Functional After Total Dose 1 x 106 RAD (Si) * Low Power Consumption - IDDSB = 20A - IDDOP = 12mA * Pin Compatible with NMOS 8254 and the Intersil 82C54 * High Speed, "No Wait State" Operation with 5MHz HS-80C86RH * Three Independent 16-Bit Counters * Six Programmable Counter Modes * Binary or BCD Counting * Status Read Back Command * Hardened Field, Self-Aligned, Junction Isolated CMOS Process * Single 5V Supply * Military Temperature Range -55oC to +125oC
Description
The Intersil HS-82C54RH is a high performance, radiation hardened CMOS version of the industry standard 8254 and is manufactured using a hardened field, self-aligned silicon gate CMOS process. It has three independently programmable and functional 16-bit counters, each capable of handling clock input frequencies of up to 5MHz. Six programmable timer modes allow the HS-82C54RH to be used as an event counter, elapsed time indicator, a programmable one-shot, or for any other timing application. The high performance, radiation hardness, and industry standard configuration of the HS-82C54RH make it compatible with the HS-80C86RH radiation hardened microprocessor. Static CMOS circuit design insures low operating power. The Intersil hardened field CMOS process results in performance equal to or greater than existing radiation resistant products at a fraction of the power.
24 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK) MIL-STD-1835 CDFP4-F24 TOP VIEW
D7 D6 D5 D4 D3 D2 D1 D0 CLK 0 OUT 0 GATE 0 GND 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 VDD WR RD CS A1 A0 CLK 2 OUT 2 GATE 2 CLK 1 GATE 1 OUT1
Ordering Information
PART NUMBER HS1-82C54RH-Q HS1-82C54RH-8 HS1-82C54RH-Sample HS9-82C54RH-Q HS9-82C54RH-8 HS9-82C54RH/Sample HS9-82C54RH/Proto TEMPERATURE RANGE -55oC -55oC to to +125oC +125oC 24 Lead SBDIP 24 Lead SBDIP 24 Lead SBDIP 24 Lead Ceramic Flatpack 24 Lead Ceramic Flatpack 24 Lead Ceramic Flatpack 24 Lead Ceramic Flatpack DB NA PACKAGE
+25oC -55oC -55oC to to +125oC +125oC
+25oC -55oC to +125oC
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207 | Copyright (c) Intersil Corporation 1999
Spec Number File Number
948
518059 3043.1
HS-82C54RH Pin Description
SYMBOL D7-D0 CLK 0 OUT 0 GATE 0 GND OUT 1 GATE 1 CLK 1 GATE 2 OUT 2 CLK 2 A0, A1 PIN NUMBER 1-8 9 10 11 12 13 14 15 16 17 18 19-20 O I I I O I I TYPE I/O I O I DESCRIPTION DATA: Bi-directional three state data bus lines, connected to system data bus. CLOCK 0: Clock input of Counter 0. OUT 0: Output of Counter 0. GATE 0: Gate input of Counter 0. GROUND: Power supply connection. OUT 1: Output of Counter 1. GATE 1: Gate input of Counter 1. CLOCK 1: Clock input of Counter 1. GATE 2: Gate input of Counter 2. OUT 2: Output of Counter 2. CLOCK 2: Clock input of Counter 2. ADDRESS: Select inputs for one of the three counters or Control Word Register for read/write operations. Normally connected to the system address bus. A1 0 0 1 1 CS RD WR VDD 21 22 23 24 I I I A0 0 1 0 1 Selects Counter 0 Counter 1 Counter 2 Control Word Register
CHIP SELECT: A low on this input enables the HS-82C54RH to respond to RD and WR signals. RD and WR are ignored otherwise. READ: This input is low during CPU read operations. WRITE: This input is low during CPU write operations. VDD: The +5V power supply pin. A 0.1F capacitor between pins 12 and 24 is recommended for decoupling.
Functional Diagram
INTERNAL BUS
D7-D0
(8)
DATA BUS BUFFER
COUNTER 0
CLK 0 GATE 0 OUT 0
CONTROL WORD REGISTER
STATUS LATCH
RD WR A0 A1 CS CONTROL WORD REGISTER READ/ WRITE LOGIC
INTERNAL BUS
COUNTER 1
CLK 1 GATE 1 OUT 1
STATUS REGISTER
CRM
CRL
CONTROL LOGIC COUNTER 2 CLK 2 GATE 2 OUT 2 GATE N CLK N OUT N OLM
CE
OLL
Spec Number 949
518059
Specifications HS-82C54RH
Absolute Maximum Ratings
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +7.0V Input or Output Voltage Applied for all Grades . . . . . . . . . . . . . . . . . .VSS-0.3V to VDD+0.3V Storage Temperature Range . . . . . . . . . . . . . . . . . -65oC to +150oC Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC Lead Temperature (Soldering 10s) . . . . . . . . . . . . . . . . . . . . +300oC Typical Derating Factor. . . . . . . . . . .2.4mA/MHz Increase in IDDOP ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Reliability Information
Thermal Resistance JA JC SBDIP Package. . . . . . . . . . . . . . . . . . . . 40oC/W 6oC/W Ceramic Flatpack Package . . . . . . . . . . . 60oC/W 4oC/W Maximum Package Power Dissipation at +125oC Ambient SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.25W Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.83W If device power exceeds package dissipation capability, provide heat sinking or derate linearly at the following rate: SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25.0mW/C Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . .16.7mW/C
CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V Operating Temperature Range . . . . . . . . . . . . . . . . -55oC to +125oC Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . . . . . . .0V to +0.8V Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . . VDD -1.5V to VDD
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS GROUP A SUBGROUPS 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 LIMITS TEMPERATURE -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, +25oC, +125oC MIN -2.5 -100 2.5 -1.0 -10 MAX 1.0 10 20.0 UNITS mA A mA A A A
PARAMETER TTL Output High Current CMOST Output High Current Output Low Current Input Leakage Current Output Leakage Current Standby Power Supply Current Operating Power Supply Current Functional Tests Noise Immunity Functional Test
SYMBOL IOH1 IOH2 IOL IIL or IIH IOZL or IOZH IDDSB
CONDITIONS VDD = 4.5V, VO = 3.0V, VIN = 0V or 4.5V VDD = 4.5V, VO = 4.1V, VIN = 0V or 4.5V VDD = 4.5V, VO = 0.4V, VIN = 0V or 4.5V VDD = 5.5V, VIN = 0V or 5.5V Pins: 9, 11, 14-16, 18-23 VDD = 5.5V, VIN = 0V or 5.5V Pins: 1-8 VDD = 5.5V, VIN = GND or VDD IO = 0mA, Counters Programmed VDD = 5.5V, VIN = GND or VDD IO = 0mA, CLK0 = CLK1 = CLK2 = 5MHz VDD = 4.5V and 5.5V, VIN = GND or VDD, f = 1MHz VDD = 5.5V, VIN = GND or VDD - 1.5 and VDD = 4.5V, VIN = 0.8V or VDD
IDDOP
1, 2, 3
-
12.0
mA
FT FN
7, 8A, 8B 7, 8A, 8B
-
-
-
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS AC's Tested at Worst Case VDD (s), Guaranteed Over Full Operating Range. GROUP A SUBGROUPS 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 LIMITS TEMPERATURE -55oC, +25oC, +125oC MIN 75 0 0 240 MAX 200 UNITS ns ns ns ns ns
PARAMETER Address Stable Before RD CS Stable Before RD Address Hold Time After RD RD Pulse Width Data Delay from RD
SYMBOL TAVRL TSLRL TRHAX TRLRH TRLDV
CONDITIONS VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V
-55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, -55oC, +25oC, +25oC, +125oC +125oC
Spec Number 950
518059
Specifications HS-82C54RH
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued) AC's Tested at Worst Case VDD (s), Guaranteed Over Full Operating Range. GROUP A SUBGROUPS 9, 10, 11 LIMITS TEMPERATURE -55oC, +25oC, +125oC MIN 320 MAX UNITS ns
PARAMETER Command Recovery Time WRITE CYCLE Address Stable Before WR CS Stable Before WR Address Hold Time After WR WR Pulse Width Data Setup Time Before WR Data Hold Time After WR Command Recovery Time CLOCK AND GATE Clock Period High Pulse Width Low Pulse Width Gate Width High Gate Width Low Gate Setup Time to CLK Gate Hold Time After CLK Output Delay from CLK Output Delay from Gate Data Delay from Address Read Output Delay from WR High
SYMBOL TRHRL
CONDITIONS VDD = 4.5V
TAVWL TSLWL TWHAX TWLWH TDVWH TWHDX TWHWL
VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V
9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11
-55oC, +25oC, +125oC -55oC, -55oC, +25oC, +25oC, +125oC +125oC
0 0 0 240 225 35 320
-
ns ns ns ns ns ns ns
-55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, -55oC, +25oC, +25oC, +125oC +125oC
TCLCL TCHCL TCLCH TGHGL TGLGH TGVCH TCHGX TCLOV TGLOV TAVAV TWHOV
VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V VDD = 4.5V
9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11 9, 10, 11
-55oC, +25oC, +125oC -55oC, -55oC, +25oC, +25oC, +125oC +125oC
200 100 100 80 80 80 80 -
240 200 275 260
ns ns ns ns ns ns ns ns ns ns ns
-55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, -55oC, +25oC, +25oC, +125oC +125oC
-55oC, +25oC, +125oC -55oC, +25oC, +125oC -55oC, -55oC, +25oC, +25oC, +125oC +125oC
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS LIMITS PARAMETER Input Capacitance Output Capacitance I/O Capacitance SYMBOL CIN COUT COUT CONDITIONS VDD = Open, f = 1MHz, All measurements referenced to device ground. VDD = Open, f = 1MHz, All measurements referenced to device ground. VDD = Open, f = 1MHz, All measurements referenced to device ground. TEMPERATURE TA = +25oC MIN MAX 15 15 20 UNITS pF pF pF
TA = +25oC TA = +25oC
TIMING REQUIREMENTS RD/ to Data Float TIMING RESPONSES Clock Rise Time Clock Fall Time TCH1CH2 TCL1CL2 VDD = 4.5V and 5.5V, 1.0V to 3.5V VDD = 4.5V and 5.5V, 3.5V to 1.0V -55oC < TA < +125oC -55oC < TA < +125oC 25 25 ns ns TRHDZ VDD = 4.5V and 5.5V -55oC < TA < +125oC 8 145 ns
NOTE: The parameters listed are controlled via design or process parameters and are not directly tested. These parameters are characterized upon initial design release and upon design changes which would affect these characteristics.
Spec Number 951
518059
Specifications HS-82C54RH
TABLE 4. POST 100K RAD ELECTRICAL PERFORMANCE CHARACTERISTICS NOTE: See +25oC limits in Table 1 and Table 2 for Post RAD limits (Sub Groups 1, 7 and 9).
TABLE 5. BURN-IN DELTA PARAMETERS (+25oC) PARAMETER Standby Power Supply Current Output Leakage Current Input Leakage Current Output Low Current TTL Output High Current CMOS Output High Current * Which ever is greater. SYMBOL IDDSB IOZL, IOZH IIH, IIL IOL IOH TTL IOH CMOS DELTA LIMITS 2A 2A 200nA 500A or 10% of BBI Reading* 500A or 10% of BBI Reading* 20A or 10% of BBI Reading*
TABLE 6. APPLICABLE SUBGROUPS GROUP A SUBGROUPS CONFORMANCE GROUP Initial Test Interim Test PDA Final Test Group A (Note 1) Subgroup B5 Subgroup B6 Group C Group D Group E, Subgroup 2 NOTES: 1. Alternate Group A testing in accordance with MIL-STD-883 method 5005 may be exercised. 2. Table 5 parameters only MIL-STD-883 METHOD 100% 5004 100% 5004 100% 5004 100% 5004 Sample 5005 Sample 5005 Sample 5005 Sample 5005 Sample 5005 Sample 5005 TESTED FOR -Q 1, 7, 9 1, 7, 9, 1, 7, 2, 3, 8A, 8B, 10, 11 1, 2, 3, 7, 8A, 8B, 9, 10, 11 1, 2, 3, 7, 8A, 8B, 9, 10, 11, 1, 7, 9 N/A 1, 7, 9 1, 7, 9 RECORDED FOR -Q 1 (Note 2) 1, (Note 2) 1, 2, 3, (Note 2) N/A TESTED FOR -8 1, 7, 9 1, 7, 9 1, 7 2, 3, 8A, 8B, 10, 11 1, 2, 3, 7, 8A, 8B, 9, 10, 11 N/A N/A 1, 2, 3, 7, 8A, 8B, 9, 10, 11 1, 7, 9 1, 7, 9 RECORDED FOR -8
Spec Number 952
518059
HS-82C54RH Intersil Space Level Product Flow -Q
Wafer Lot Acceptance (All Lots) Method 5007 (Includes SEM) GAMMA Radiation Verification (Each Wafer) Method 1019, 2 Samples/Wafer, 0 Rejects 100% Die Attach 100% Nondestructive Bond Pull, Method 2023 Sample - Wire Bond Pull Monitor, Method 2011 Sample - Die Shear Monitor, Method 2019 or 2027 100% Internal Visual Inspection, Method 2010, Condition A CSI and/or GSI PreCap (Note 6) 100% Temperature Cycle, Method 1010, Condition C, 10 Cycles 100% Constant Acceleration, Method 2001, Condition per Method 5004 100% PIND, Method 2020, Condition A 100% External Visual 100% Serialization 100% Initial Electrical Test (T0) 100% Static Burn-In 1, Condition A or B, 72 Hours Min, +125oC Min, Method 1015
NOTES: 1. Failures from subgroup 1, 7 and deltas are used for calculating PDA. The maximum allowable PDA = 5% with no more than 3% of the failures from subgroup 7. 2. Radiographic (X-Ray) inspection may be performed at any point after serialization as allowed by Method 5004. 3. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005. 4. Group B and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include separate line items for Group B Test, Group B Samples, Group D Test and Group D Samples. 5. Group D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required, the P.O. should include a separate line item for Group D Generic Data. Generic data is not guaranteed to be available and is therefore not available in all cases. 6. CSI and/or GSI inspections are optional and will not be performed unless required by theP.O. When required, the P.O. should include separate line items for CSI PreCap inspection, CSI final inspection, GSI PreCap inspection, and/or GSI final inspection. 7. Data Package Contents: * Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quantity). * Wafer Lot Acceptance Report (Method 5007). Includes reproductions of SEM photos with percent of step coverage. * GAMMA Radiation Report. Contains Cover page, disposition, Rad Dose, Lot Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read and Record data on file at Intersil. * X-Ray report and film. Includes penetrometer measurements. * Screening, Electrical, and Group A attributes (Screening attributes begin after package seal). * Lot Serial Number Sheet (Good units serial number and lot number). * Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test. * Group B and D attributes and/or Generic data is included when required by the P.O. * The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed by an authorized Quality Representative.
100% Interim Electrical Test 1 (T1) 100% Delta Calculation (T0-T1) 100% PDA 1, Method 5004 (Note 1) 100% Dynamic Burn-In, Condition D, 240 Hours, +125oC or Equivalent, Method 1015 100% Interim Electrical Test 2(T2) 100% Delta Calculation (T0-T2) 100% PDA 2, Method 5004 (Note 1) 100% Final Electrical Test 100% Fine/Gross Leak, Method 1014 100% Radiographic (X-Ray), Method 2012 (Note 2) 100% External Visual, Method 2009 Sample - Group A, Method 5005 (Note 3) Sample - Group B, Method 5005 (Note 4) Sample - Group D, Method 5005 (Notes 4 and 5) 100% Data Package Generation (Note 7) CSI and/or GSI Final (Note 6)
Spec Number 953
518059
HS-82C54RH Intersil Space Level Product Flow -8
GAMMA Radiation Verification (Each Wafer) Method 1019, 2 Samples/Wafer, 0 Rejects 100% Die Attach Periodic- Wire Bond Pull Monitor, Method 2011 Periodic- Die Shear Monitor, Method 2019 or 2027 100% Internal Visual Inspection, Method 2010, Condition B CSI an/or GSI PreCap (Note 5) 100% Temperature Cycle, Method 1010, Condition C, 10 Cycles 100% Constant Acceleration, Method 2001, Condition per Method 5004 100% External Visual 100% Initial Electrical Test
NOTES: 1. Failures from subgroup 1, 7 are used for calculating PDA. The maximum allowable PDA = 5%. 2. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005. 3. Group B, C and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include separate line items for Group B Test, Group C Test, Group C Samples, Group D Test and Group D Samples. 4. Group C and/or Group D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When required, the P.O. should include a separate line item for Group C Generic Data and/or Group D Generic Data. Generic data is not guaranteed to be available and is therefore not available in all cases. 5. CSI and/or GSI inspections are optional and will not be performed unless required by theP.O. When required, the P.O. should include separate line items for CSI PreCap inspection, CSI final inspection, GSI PreCap inspection, and/or GSI final inspection. 6. Data Package Contents: * Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quantity). * GAMMA Radiation Report. Contains Cover page, disposition, Rad Dose, Lot Number, Test Package used, Specification Numbers, Test equipment, etc. Radiation Read and Record data on file at Intersil. * Screening, Electrical, and Group A attributes (Screening attributes begin after package seal). * Group B, C and D attributes and/or Generic data is included when required by the P.O. * The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed by an authorized Quality Representative.
100% Dynamic Burn-In, Condition D, 160 Hours, +125oC or Equivalent, Method 1015 100% Interim Electrical Test 100% PDA, Method 5004 (Note 1) 100% Final Electrical Test 100% Fine/Gross Leak, Method 1014 100% External Visual, Method 2009 Sample - Group A, Method 5005 (Note 2) Sample - Group B, Method 5005 (Note 3) Sample - Group C, Method 5005 (Notes 3 and 4) Sample - Group D, Method 5005 (Notes 3 and 4) 100% Data Package Generation (Note 6) CSI and/or GSI Final (Note 5)
Spec Number 954
518059
HS-82C54RH AC Test Circuits
V1 R1 OUTPUT FROM DEVICE UNDER TEST R2 C1* TEST POINT INPUT VIH +0.4V 1.5V VIL -0.4V 1.5V VOL INPUT VOH
AC Testing Input, Output Waveform
* Includes stray and jig capacitance TEST CONDITION DEFINITION TABLE TEST CONDITION 1 V1 1.7V R1 510 R2 OPEN C1 150pF
NOTE: AC Testing: All input signals must switch between VIL -0.4V and VIH +0.4V. Input rise and fall times are driven at 1ns/V.
Waveforms
A0-1 TAVWL CS TSLWL DATA BUS VALID TDVWH WR TWLWH TWHDX DATA BUS RD TRHDZ TRLDV VALID TWHAX CS TSLRL TRLRH A0-1 TAVRL TRHAX
FIGURE 1. WRITE
FIGURE 2. READ
TCHCL
TCLCH
TCL1CL2 TCLCL
TGVCH
CLK TRHRL TWHWL RD, WR GATE G
TCH1CH2 TGVCH
TGHGL
TCHGX
TGLGH OUTPUT 0 TCHGX TGLOV
TCLOV
FIGURE 3. RECOVERY
FIGURE 4. CLOCK AND GATE
Spec Number 955
518059
HS-82C54RH Burn-In Circuits
VDD VDD
1 2 3 4 5 6 7 8 F0 OPEN 9 10 11 12
24 23 22 21 20 19 18 17 16 15 14 13 OPEN OPEN F0
F3 F4 F5 F6 F7 F8 F9 F10 F1 LOAD F11
1 2 3 4 5 6 7 8 9 10 11 12
24 23 22 21 20 19 18 17 16 15 14 13 LOAD LOAD 2.7K VDD 2.7K LOAD F2 F0 F0
STATIC CONFIGURATION FOR BOTH FLATPACK & SBDIP PACKAGE NOTES: 1. 2. 3. 4. 5. VDD = 6.5V 5% TA = +125oC Minimum Resistors = 10k IDD < 100A AC: F0 is compliment of F0 F0 is a 50% duty cycle pulse burst F0 is left high after pulse burst NOTES: 1. 2. 3. 4. 5. 6. 7. 8.
DYNAMIC CONFIGURATION FOR BOTH FLATPACK & SBDIP PACKAGE VDD = 6.5V 5%(Burn-In) VDD = 6.0V 5%(Life Test) TA = +125oC Minimum IDD < 20mA Resistors = 10K, except for loads = 2.7k -0.3V VIL 0.8V VDD -1.0V VIH VDD +0.5V AC: F0 is compliment of F0 F0 = 100kHz 10%, 50% Duty Cycle F1 = F0/2, F2 = F1/2 . . . F10 = F9/2
Irradiation Circuits
HS-82C54RH
1 2 3 4 5 5.5V 6 7 8 9 N/C 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 N/C N/C 5.5V
NOTES: 1. VDD = 5.5V 10%, TA = +25oC 2. Group E Testing is performed in Sidebrazed DIP 3. Group E Sample Size is 2 die/wafer
Spec Number 956
518059
HS-82C54RH Functional Description
General The HS-82C54RH is a programmable interval timer/counter designed for use with microcomputer systems. It is a general purpose, multi-timing element that can be treated as an array of I/O ports in the system software. The HS-82C54RH solves one of the most common problems in any microcomputer system, the generation of accurate time delays under software control. Instead of setting up timing loops in software, the programmer configures the HS-82C54RH to match his requirements and programs one of the counters for the desired delay. After the desired delay, the HS-82C54RH will interrupt the CPU. Software overhead is minimal and variable length delays can easily be accommodated. Some of the other timer functions common to micro-computers which can be implemented with the HS-82C54RH are: * Real time clock * Event counter * Digital one-shot * Programmable rate generator * Square wave generator * Binary rate multiplier * Complex waveform generator * Complex motor controller Data Bus Buffer This three-state, bi-directional, 8-bit buffer is used to interface the HS-82C54RH to the system bus (see Figure 5). Read/Write Logic The Read/Write Logic accepts inputs from the system bus and generates control signals for the other functional blocks of the HS-82C54RH. A1 and A0 select one of the three counters or the Control Word Register to be read from/ written into. A "low" on the RD input tells the HS-82C54RH that the CPU is reading one of the counters. A "low" on the WR input tells the HS-82C54RH that the CPU is writing either a Control Word or an initial count. Both RD and WR are qualified by CS; RD and WR are ignored unless the HS-82C54RH has been selected by holding CS low. Control Word Register The Control Word Register (Figure 6) is selected by the Read/Write Logic when A1, A0 = 11. If the CPU then does a write operation to the HS-82C54RH, the data is stored in the Control Word Register and is interpreted as a Control Word used to define the Counter operation. The Control Word Register can only be written to; status information is available with the Read-Back Command. Counter 0, Counter 1, Counter 2 These three functional clocks are identical in operation, so only a single Counter will be described. The internal block diagram of a single counter is shown in Figure 7. The counters are fully independent. Each Counter may operate in a different Mode. The Control Word Register is shown in the figure; it is not part of the Counter itself, but its contents determine how the Counter operates.
D7-D0
(8)
DATA BUS BUFFER
COUNTER 0
CLK 0 GATE 0 OUT 0
D7-D0
(8)
DATA BUS BUFFER
COUNTER 0
CLK 0 GATE 0 OUT 0
INTERNAL BUS
RD WR A0 A1 CS
READ/ WRITE LOGIC
COUNTER 1
CLK 1 GATE 1 OUT 1
RD WR A0 A1 CS
INTERNAL BUS
READ/ WRITE LOGIC
COUNTER 1
CLK 1 GATE 1 OUT 1
CONTROL WORD REGISTER
COUNTER 2
CLK 2 GATE 2 OUT 2
CONTROL WORD REGISTER
COUNTER 2
CLK 2 GATE 2 OUT 2
FIGURE 5. DATA BUS BUFFER AND READ/WRITE LOGIC FUNCTION
FIGURE 6. CONTROL WORD REGISTER AND COUNTER FUNCTIONS
Spec Number 957
518059
HS-82C54RH
INTERNAL BUS
CONTROL WORD REGISTER
STATUS LATCH
Basically, the select inputs A0, A1 connect to the A0, A1 address bus signals of the CPU. The CS can be derived directly from the address bus using a linear select method or it can be connected to the output of a decoder, such as a Intersil HD-6440 for larger systems.
CRL A1 A0 CONTROL BUS I/OR I/OW ADDRESS BUS (16)
STATUS REGISTER
CRM
CONTROL LOGIC
CE
DATA BUS (8) 8 A1 A0 CS D0-D7 HS-82C54RH COUNTER 1 OUT GATE CLK RD WR
GATE N CLK N OUT N
OLM
OLL
COUNTER 0 OUT GATE CLK
COUNTER 2 OUT GATE CLK
FIGURE 7. COUNTER INTERNAL BLOCK DIAGRAM
FIGURE 8. HS-82C54RH SYSTEM INTERFACE
The Status Register, shown in the figure, when latched, contains the current contents of the Control Word Register and status of the output and null count flag. (See detailed explanation of the Read-Back Command.) The actual counter is labeled CE for "Counting Element". It is a 16-bit presettable synchronous down counter. OLM and OLL are two 8-bit latches. OL stands for "Output Latch", subscripts M and L for "Most significant byte" and "Least significant byte", respectively. Both are normally referred to as one unit and called just OL. These latches normally "follow" the CE, but if a suitable Counter Latch Command is sent to the HS-82C54RH, the OL latches the present count until read by the CPU and then returns to "following" the CE. One latch at a time is enabled by the counter's Control Logic to drive the internal bus. This is how the 16-bit Counter communicates over the 8-bit internal bus. Note that the CE itself cannot be read; whenever you read the count, it is the OL that is being read. Similarly, there are two 8-bit registers called CRM and CRL (for "Count Register"). Both are normally referred to as one unit and called just CR. When a new count is written to the Counter, the count is stored in the CR and later transferred to the CE. The Control Logic allows one register at a time to be loaded from the internal bus. Both bytes are transferred to the CE simultaneously. CRM and CRL are cleared when the Counter is programmed for one byte counts (either most significant byte only or least significant byte only) the other byte will be zero. Note that the CE cannot be written into; whenever a count is written, it is written into the CR. The Control Logic is also shown in the diagram. CLKn, GATEn, and OUTn are all connected to the outside world through the Control Logic. HS-82C54RH System Interface The HS-82C54RH is treated by the system software as an array of peripheral I/O ports; three are Counters and the fourth is a Control Word Register for MODE programming.
Operational Description
General After power-up, the state of the HS-82C54RH is undefined. The Mode, count value, and output of all Counters are undefined. How each Counter operates is determined when it is programmed. Each Counter must be programmed before it can be used. Unused Counters need not be programmed. Programming The HS-82C54RH Counters are programmed by writing a Control Word and then an initial count. All Control Words are written into the Control Word Register, which is selected when A1, A0 = 11. The Control Word specifies which Counter is being programmed. By contrast, initial counts are written into the Counters, not the Control Word Register. The A1, A0 inputs are used to select the Counter to be written into. The format of the initial count is determined by the Control Word used. Write Operations The programming procedure for the HS-82C54RH is very flexible. Only two conventions need to be remembered: 1. For each Counter, the Control Word must be written before the initial count is written. 2. The initial count must follow the count format specified in the Control Word (least significant byte only, most significant byte only, or least significant byte and then most significant byte). Since the Control Word Register and the three Counter shave separate addresses (selected by the A1, A0 inputs), and each Control Word specifies the Counter it applies to (SC0, SC1 bits), no special instruction sequence is required. Any programming sequence that follows the conventions above is acceptable. Spec Number
518059
958
HS-82C54RH
Control Word Format A1, A0 = 11; CS = 0; RD = 1; WR = 0
D7 SC1 SC - Select Counter: SC1 0 0 1 1 SC0 0 1 0 1 Select Counter 0 Select Counter 1 Select Counter 2 Read-Back Command (See Read Operations) D6 SC2 D5 RW1 D4 RW0 D3 M2 M - Mode: M2 0 0 X X 1 1 Counter Latch Command (See Read Operations) Read/Write least significant byte only. Read/Write most significant byte only. Read/Write least significant byte first, then most significant byte. M1 0 0 1 1 0 0 M0 0 1 0 1 0 1 Mode 0 Mode 1 Mode 2 Mode 3 Mode 4 Mode 5 D2 M1 D1 M0 D0 BCD
RW - Read/Write RW1 0 0 1 1 RW0 0 1 0 1
BCD - Binary Coded Decimal: 0 1 Binary Counter 16-bits Binary Coded Decimal (BCD) Counter (4 Decades)
NOTE: Don't Care bits (X) should be 0 to insure compatibility with future products.
FIGURE 9. CONTROL WORD FORMAT
A1 Control Word - Counter 0 LSB of count - Counter 0 MSB of count - Counter 0 Control Word - Counter 1 LSB of count - Counter 1 MSB of count - Counter 1 Control Word - Counter 2 LSB of count - Counter 2 MSB of count - Counter 2 1 0 0 1 0 0 1 1 1 A1 Control Word - Counter 0 Control Word - Counter 1 Control Word - Counter 2 LSB of count - Counter 2 LSB of count - Counter 1 LSB of count - Counter 0 MSB of count - Counter 0 MSB of count - Counter 1 MSB of count - Counter 2 1 1 1 1 0 0 0 0 1
A0 1 0 0 1 1 1 1 0 0 A0 1 1 1 0 1 0 0 1 0 Control Word - Counter 1 Control Word - Counter 0 LSB of count - Counter 1 Control Word - Counter 2 LSB of count - Counter 0 MSB of count - Counter 1 LSB of count - Counter 2 MSB of count - Counter 0 MSB of count - Counter 2 Control Word - Counter 2 Control Word - Counter 1 Control Word - Counter 0 LSB of count - Counter 2 MSB of count - Counter 2 LSB of count - Counter 1 MSB of count - Counter 1 LSB of count - Counter 0 MSB of count - Counter 0
A1 1 1 1 1 1 0 0 0 0 A1 1 1 0 1 0 0 1 0 1
A0 1 1 1 0 0 1 1 0 0 A0 1 1 1 1 0 1 0 0 0
NOTE: In all four examples, all counters are programmed to Read/Write two-byte counts. These are only four of many possible programming sequences. FIGURE 10. A FEW POSSIBLE PROGRAMMING SEQUENCES
Spec Number 959
518059
HS-82C54RH
A new initial count may be written to a Counter at any time without affecting the Counter's programmed Mode in anyway. Counting will be affected as described in the Mode definitions. The new count must follow the programmed count format. If a Counter is programmed to read/write two-byte counts, the following precaution applies: A program must not transfer control between writing the first and second byte to another routine which also writes into that same Counter. Otherwise, the Counter will be loaded with an incorrect count. Read Operations It is often desirable to read the value of a Counter without disturbing the count in progress. This is easily done in the HS-82C54RH. There are three possible methods for reading the Counters. The first is through the Read-Back Command, which is explained later. The second is a simple read operation of the Counter, which is selected with the A1, A0 inputs. The only requirement is that the CLK input of the selected Counter must be inhibited by using either the GATE input or external logic. Otherwise, the count may be in process of changing when it is read, giving an undefined result. Counter Latch Command The other method for reading the Counters involves a special software command called the "Counter Latch Command". Like a Control Word, this command is written to the Control Word Register, which is selected when A1, A0 = 11. Also, like a Control Word, the SC0, SC1 bits select one of the three Counters, but two other bits, D5 and D4, distinguish this command from a Control Word. A1, A0 = 11; CS = 0; RD = 1; WR = 0
D7 SC1 D6 SC0 D5 0 D4 0 D3 X D2 X D1 X D0 X
held in the latch until it is read by the CPU (or until the Counter is reprogrammed). The count is then unlatched automatically and the OL returns to "following" the Counting Element (CE). This allows reading the contents of the Counters "on the fly" without affecting counting in progress. Multiple Counter Latch Commands may be used to latch more than one Counter. Each latched Counter's OL holds its count until read. Counter Latch Commands do not affect the programmed Mode of the Counter in any way. If a Counter is latched and then, some time later, latched again before the count is read, the second Counter Latch Command is ignored. The count read will be the count at the time the first Counter Latch Command was issued. With either method, the count must be read according to the programmed format; specifically, if the Counter is programmed for two byte counts, two bytes must be read. The two bytes do not have to be read one right after the other; read or write or programming operations of other Counters may be inserted between them. Another feature of the HS-82C54RH is that reads and writes of the same Counter may be interleaved; for example, if the Counter is programmed for two byte counts, the following sequence is valid. 1. 2. 3. 4. Read least significant byte. Write new least significant byte. Read most significant byte. Write new most significant byte.
If a Counter is programmed to read or write two-byte counts, the following precaution applies: A program MUST NOT transfer control between reading the first and second byte to another routine which also reads from that same Counter. Otherwise, an incorrect count will be read. Read-Back Command The Read-Back Command allows the user to check the count value, programmed Mode, and current state of the OUT pin and Null Count flag of the selected Counter(s). The command is written into the Control Word Register and has the format shown in Figure 12. The command applies to the Counters selected by setting their corresponding bits D3, D2, D1 = 1. A0, A1 = 11; CS = 0; RD = 1; WR = 0
D7 1 D5: D4: D3: D2: D1: D0: D6 1 D5 COUNT D4 STATUS D3 D2 D1 D0 0
SC1, SC0 - specify counter to be latched SC1 0 0 1 1 SC1 0 0 1 1 Counter 0 1 2 Read-Back Command
D5, D4 = 00 designates Counter Latch Command X = Don't Care NOTE: Don't Care bits (X) should be 0 to insure compatibility with future products. FIGURE 11. COUNTER LATCH COMMAND FORMAT
CNT 2 CNT 1 CNT 0
0 = Latch count of selected Counters(s) 0 = Latch status of selected Counters(s) 1 = Select Counter 2 1 = Select Counter 1 1 = Select Counter 0 Reserved for future expansion; Must be 0 FIGURE 12. READ-BACK COMMAND FORMAT
The selected Counter's Output Latch (OL) latches the count when the Counter Latch Command is received. This count is
Spec Number 960
518059
HS-82C54RH
The Read-Back Command may be used to latch multiple Counter Output Latches (OL) by setting the COUNT bit D5 = 0 and selecting the desired Counter(s). This single command is functionally equivalent to several Counter Latch Commands, one for each Counter latched. Each Counter's latched count is held until it is read (or the Counter is reprogrammed). That Counter is automatically unlatched when read, but other Counters remain latched until they are read. If multiple count Read-Back Commands are issued to the same Counter without reading the count, all but the first are ignored; i.e., the count which will be read is the count at the time the first Read-Back Command was issued. The Read-Back Command may also be used to latch status information of selected Counter(s) by setting STATUS bit D4 = 0. Status must be latched to be read; status of a Counter is accessed by a read from that Counter. The Counter status format is shown in Figure 13. Bits D5 through D0 contain the Counter's programmed Mode exactly as written in the last Mode Control Word. OUTPUT bit D7 contains the current state of the OUT pin. This allows the user to monitor the Counter's output via software, possibly eliminating some hardware from a system.
D7 OUT PUT D6 NULL COUNT D5 RW1 D4 RW0 D3 M2 D2 M1 D1 M0 D0 BCD
Counting Element (CE), it can't be read from the Counter. If the count is latched or read before this time, the count value will not reflect the new count just written. The operation of Null Count is shown in Figure 14.
THIS ACTION: A. Write to the Control Word Register: (Note 1) B. Write to the Count Register (CR): (Note 2) C. New count is loaded into CE (CR CE): NOTES: 1. Only the Counter specified by the Control Word will have its Null Count set to 1. Null Count bits of other Counters are unaffected. 2. If the Counter is programmed for two-byte counts (least significant byte then most significant byte) Null Count goes to 1 when the second byte is written. FIGURE 14. NULL COUNT OPERATION CAUSES: Null Count = 1 Null Count = 1 Null Count = 0
If multiple status latch operations of the Counter(s) are performed without reading the status, all but the first are ignored; i.e., the status that will be read is the status of the Counter at the time the first status Read-Back Command was issued. Both count and status of the selected Counter(s) may be latched simultaneously by setting both COUNT and STATUS bits D5, D4 = 0. This is functionally the same as issuing two separate Read-Back Commands at once, and the above discussions apply here also. Specifically, if multiple count and/or status Read-Back Commands are issued to the same Counter(s) without any intervening reads, all but the first are ignored. This is illustrated in Figure 15. If both count and status of a Counter are latched, the first read operation of that Counter will return latched status, regardless of which was latched first. The next one or two reads (depending on whether the Counter is programmed for one or two byte counts) return latched count. Subsequent reads return unlatched count.
D7 1 = Out Pin is 1 0 = Out pin is 0 D6 1 = Null count 0 = Count available for reading D5-D0 = Counter programmed mode (See Figure 5) FIGURE 13. STATUS BYTE
NULL COUNT bit D6 indicates when the last count written to the Counter Register (CR) has been loaded into the Counting Element (CE). The exact time this happens depends on the Mode of the Counter and is described in the Mode Definitions, but until the count is loaded into the
COMMAND D7 1 1 1 1 1 1 D6 1 1 1 1 1 1 D5 0 1 1 0 0 1 D4 0 0 0 1 0 0 D3 0 0 1 1 0 0 D2 0 1 1 0 1 1 D1 1 0 0 0 0 0 D0 0 0 0 0 0 0
DESCRIPTION Read back count and status of Counter 0 Read-back status of Counter 1 Read-back status of Counters 2, 1 Read-back count of Counter 2 Read-back count and status of Counter 1 Read-back status of Counter 1
RESULT Count and status latched for Counter 0 Status latched for Counter 1 Status latched for Counter 2, but not Counter 1 Count latched for Counter 2 Count latched for Counter 1, but not status Command ignored, status already latched for Counter 1
FIGURE 15. READ-BACK COMMAND EXAMPLE
Spec Number 961
518059
HS-82C54RH
CS 0 0 0 0 0 0 0 0 1 0 RD 1 1 1 1 0 0 0 0 X 1 WR 0 0 0 0 1 1 1 1 X 1 A1 0 0 1 1 0 0 1 1 X X A0
WR CW = 10 LSB = 4
0 1 0 1 0 1 0 1 X X
Write into Counter 0 Write into Counter 1 Write into Counter 2 Write Control Word Read from Counter 0 Read from Counter 1 Read from Counter 2 No-Operation (Three-State) No-Operation (Three-State) No-Operation (Three-State)
WR CLK GATE OUT N N N N 0 3 0 2 0 2 0 2 0 1 0 0 FF FF CLK GATE OUT N N N N 0 4 0 3 0 2 0 1 0 0 FF FF FF FE
CW = 12
LSB = 3
FIGURE 16. READ/WRITE OPERATIONS SUMMARY
Mode Definitions
The following are defined for use in describing the operation of the HS-82C54RH. CLK PULSE: A rising edge, then a falling edge, in that order, of a Counter's CLK input. TRIGGER: A rising edge of a Counter's Gate input. COUNTER LOADING: The transfer of a count from the CR to the CE (See "Functional Description") Mode 0: Interrupt on Terminal Count Mode 0 is typically used for event counting. After the Control Word is written, OUT is initially low, and will remain low until the Counter reaches zero. OUT then goes high and remains high until a new count or a new Mode 0 Control Word is written to the Counter. GATE = 1 enables counting; GATE = 0 disables counting. GATE has no effect on OUT. After the Control Word and initial count are written to a Counter, the initial count will be loaded on the next CLK pulse. This CLK pulse does not decrement the count, so for an initial count of N, OUT does not go high until N + 1 CLK pulses after the initial count is written. If a new count is written to the Counter it will be loaded on the next CLK pulse and counting will continue from the new count. If a two-byte count is written, the following happens: 1. Writing the first byte disables counting. OUT is set low immediately (no clock pulse required). 2. Writing the second byte allows the new count to be loaded on next CLK pulse. This allows the counting sequence to be synchronized by software. Again OUT does not go high until N + 1 CLK pulses after the new count of N is written. If an initial count is written while GATE = 0, it will still beloaded on the next CLK pulse. When GATE goes high, OUT will go high N CLK pulses later; no CLK pulse is needed to load the Counter as this has already been done.
CW = 10 WR CLK GATE OUT N N
LSB = 3
LSB = 2
N
N
0 3
0 2
0 1
0 2
0 1
0 0
FF FF
NOTES: 1. Counters are programmed for binary (not BCD) counting and for reading/writing least significant byte (LSB) only. 2. The Counter is always selected (CS always low). 3. CW stands for "Control Word"; CW = 10 means a Control Word of 10, Hex is written to the Counter. 4. LSB stands for "Least significant byte" of count. 5. Numbers below diagrams are count values. The lower number is the least significant byte. The upper number is the most significant byte. Since the Counter is programmed to read/write LSB only, the most significant byte cannot be read. 6. N stands for an undefined count. 7. Vertical lines show transitions between count values. FIGURE 17. MODE 0
Mode 1: Hardware Retriggerable One-Shot OUT will be initially high. OUT will go low on the CLK pulse following a trigger to begin the one-shot pulse, and will remain low until the Counter reaches zero. OUT will then go high and remain high until the CLK pulse after the next trigger. After writing the Control Word and initial count, the Counter is armed. A trigger results in loading the Counter and setting OUT low on the next CLK pulse, thus starting the one-shot pulse N CLK cycles in duration. The one-shot is retriggerable, hence OUT will remain low for N CLK pulses after any trigger. The one-shot pulse can be repeated without rewriting the same count into the Counter. GATE has no effect on OUT. If a new count is written to the Counter during a one-shot pulse, the current one-shot is not affected unless the Counter is retriggered. In that case, the Counter is loaded
Spec Number 962
518059
HS-82C54RH
with the new count and the one-shot pulse continues until the new count expires.
CW = 12 WR CLK GATE OUT N N N N N 0 3 0 2 0 1 0 0 FF FF 0 3 0 2 LSB = 3
After writing a Control Word and initial count, the Counter will be loaded on the next CLK pulse. OUT goes low N CLK pulses after the initial count is written. This allows the Counter to be synchronized by software also. Writing a new count while counting does not affect the current counting sequence. If a trigger is received after writing a new count but before the end of the current period, the Counter will be loaded with the new count on the next CLK pulse and counting will continue from the new count. Otherwise, the new count will be loaded at the end of the current counting cycle.
CW = 14 LSB = 3 WR CLK GATE OUT
CW = 12 WR CLK GATE OUT N N
LSB = 3
N
N
N
0 3
0 2
0 1
0 3
0 2
0 1
0 0 WR CLK GATE OUT
N
N
N
N
0 3
0 2
0 1
0 3
0 2
0 1
0 3
CW = 12 WR CLK GATE OUT N N
LSB = 2
LSB = 4
CW = 12 LSB = 3
N
N
N
0 2
0 1
0 0
FF FF
FF FE
0 4
0 3 WR CLK GATE OUT
N
N
N
N
0 3
0 2
0 2
0 3
0 2
0 1
0 3
NOTES: 1. Counters are programmed for binary (not BCD) counting and for reading/writing least significant byte (LSB) only. 2. The Counter is always selected (CS always low). 3. CW stands for "Control Word"; CW = 10 means a Control Word of 10, Hex is written to the Counter. 4. LSB stands for "Least significant byte" of count. 5. Numbers below diagrams are count values. The lower number is the least significant byte. The upper number is the most significant byte. Since the Counter is programmed to read/write LSB only, the most significant byte cannot be read. 6. N stands for an undefined count. 7. Vertical lines show transitions between count values. FIGURE 18. MODE 1
CW = 14 LSB = 4
LSB = 5
N
N
N
N
0 4
0 3
0 2
0 1
0 5
0 4
0 3
NOTES: 1. Counters are programmed for binary (not BCD) counting and for reading/writing least significant byte (LSB) only. 2. The Counter is always selected (CS always low). 3. CW stands for "Control Word"; CW = 10 means a Control Word of 10, Hex is written to the Counter. 4. LSB stands for "Least significant byte" of count. 5. Numbers below diagrams are count values. The lower number is the least significant byte. The upper number is the most significant byte. Since the Counter is programmed to read/write LSB only, the most significant byte cannot be read. 6. N stands for an undefined count. 7. Vertical lines show transitions between count values. FIGURE 19. MODE 2
Mode 2: Rate Generator This Mode functions like a divide-by-N counter. It is typically used to generate a Real Time Clock interrupt. OUT will initially be high. When the initial count has decremented to 1, OUT goes low for one CLK pulse. OUT then goes high again, the Counter reloads the initial count and the process is repeated. Mode 2 is periodic; the same sequence is repeated indefinitely. For an initial count of N, the sequence repeats every N CLK cycles. GATE = 1 enables counting; GATE = 0 disables counting. If GATE goes low during an output pulse, OUT is set high immediately. A trigger reloads the Counter with the initial count on the next CLK pulse; OUT goes low N CLK pulses after the trigger. Thus the GATE input can be used to synchronize the Counter.
Mode 3: Square Wave Mode Mode 3 is typically used for Baud rate generation. Mode 3 is similar to Mode 2 except for the duty cycle of OUT. OUT will initially be high. When half the initial count has expired, OUT goes low for the remainder of the count. Mode 3 is periodic; the sequence above is repeated indefinitely. An initial count of N results in a square wave with a period of N CLK cycles. Spec Number
518059
963
HS-82C54RH
GATE = 1 enables counting; GATE = 0 disables counting. If GATE goes low while OUT is low, OUT is set high immediately; no CLK pulse is required. A trigger reloads the Counter with the initial count on the next CLK pulse. Thus the GATE input can be used to synchronize the Counter.After writing a Control Word and initial count, the Counter will be loaded on the next CLK pulse. This allows the Counter to be synchronized by software also. Writing a new count while counting does not affect the current counting sequence. If a trigger is received after writing a new count but before the end of the current half-cycle of the square wave, the Counter will be loaded with the new count on the next CLK pulse and counting will continue from the new count. Otherwise, the new count will be loaded at the end of the current half-cycle. Mode 3 is implemented as follows: EVEN COUNTS: OUT is initially high. The initial count is loaded on one CLK pulse and then is decremented by two on succeeding CLK pulses. When the count expires, OUT changes value and the Counter is reloaded with the initial count. The above process is repeated indefinitely. ODD COUNTS: OUT is initially high. The initial count is loaded on one CLK pulse, decremented by one on the next CLK pulse, and then decremented by two on succeeding CLK pulses. When the count expires, OUT goes low and the Counter is reloaded with the initial count. The count is decremented by three on the next CLK pulse, and then by two on succeeding CLK pulses.When the count expires, OUT goes high again and the Counter is reloaded with the initial count. The above process is repeated indefinitely. So for odd counts, OUT will be high for (N + 1)/2 counts and low for (N-1)/2 counts. Mode 4: Software Triggered Mode OUT will be initially high. When the initial count expires, OUT will go low for one CLK pulse then go high again.The counting sequence is "Triggered" by writing the initial count. GATE = 1 enables counting; GATE = 0 disables counting. GATE has no effect on OUT. After writing a Control Word and initial count, the Counter will be loaded on the next CLK pulse. This CLK pulse does not decrement the count, so for an initial count of N, OUT does not strobe low until N + 1 CLK pulses after the initial count is written. If a new count is written during counting, it will be loaded on the next CLK pulse and counting will continue from the new count. If a two-byte count is written, the following happens: 1. Writing the first byte has no effect on counting. 2. Writing the second byte allows the new count to be loaded on the next CLK pulse. This allows the sequence to be "retriggered" by software. OUT strobes low N + 1 CLK pulses after the new count of N is written. Mode 5: Hardware Triggered Strobe (Retriggerable) OUT will initially be high. Counting is triggered by a rising edge of GATE. When the initial count has expired, OUT will go low for one CLK pulse and then go high again.
WR CLK GATE OUT N N N N 0 4 0 2 0 4 0 2 0 2 0 2 0 4 0 2 0 4 0 2 CW = 16 LSB = 4 WR CLK GATE OUT N N N N 0 4 0 2 0 4 0 2 0 4 0 2 0 4 0 2 0 4 0 2
After writing the Control Word and initial count, the Counter will not be loaded until the CLK pulse after a trigger. This CLK pulse does not decrement the count, so for an initial count of N, OUT does not strobe low until N + 1 CLK pulses after trigger. A trigger results in the Counter being loaded with the initial count on the next CLK pulse. This allows the counting sequence to be regretted. OUT strobes low N + 1 CLK pulses after any new trigger. GATE has no effect on the state of OUT. If a new count is written during counting, the current counting sequence will not be affected. If a trigger occurs after the new count is written but before the current count expires, the Counter will be loaded with the new count on the next CLK pulse and counting will continue from there.
CW = 16 LSB = 5 WR CLK GATE OUT N N N N 0 5 0 4 0 2 0 5 0 2 0 5 0 4 0 2 0 5 0 2
CW = 16 LSB = 4
NOTES: 1. Counters are programmed for binary (not BCD) counting and for reading/writing least significant byte (LSB) only. 2. The Counter is always selected (CS always low). 3. CW stands for "Control Word"; CW = 10 means a Control Word of 10, Hex is written to the Counter. 4. LSB stands for "Least significant byte" of count. 5. Numbers below diagrams are count values. The lower number is the least significant byte. The upper number is the most significant byte. Since the Counter is programmed to read/write LSB only, the most significant byte cannot be read. 6. N stands for an undefined count. 7. Vertical lines show transitions between count values. FIGURE 20. MODE 3
Spec Number 964
518059
HS-82C54RH
CW = 18 LSB = 3 WR CLK GATE OUT N N N N 0 3 0 2 0 1 0 0 FE FF FF FF FE FD WR CLK GATE OUT N N N N N 0 3 0 2 0 1 0 0 FF 0 FF 3 CW = 1A LSB = 3
CW = 18 LSB = 3 WR CLK GATE OUT N N N N 0 3 0 3 0 3 0 2 0 1 0 0 FF FF WR CLK GATE OUT
CW = 1A LSB = 3
N
N
N
N
N
N
0 3
0 2
0 3
0 2
0 1
0 0
FF FF
CW = 18 LSB = 3 WR CLK GATE OUT N N N N 0 3
LSB = 2 WR CLK GATE OUT 0 2 0 1 0 2 0 1 0 0 FF FF
CW = 1A LSB = 3
LSB = 5
N
N
N
N
N
0 3
0 2
0 1
0 0
FF FF FF FE
0 5
0 4
NOTES: 1. Counters are programmed for binary (not BCD) counting and for reading/writing least significant byte (LSB) only. 2. The Counter is always selected (CS always low). 3. CW stands for "Control Word"; CW = 10 means a Control Word of 10, Hex is written to the Counter. 4. LSB stands for "Least significant byte" of count. 5. Numbers below diagrams are count values. The lower number is the least significant byte. The upper number is the most significant byte. Since the Counter is programmed to read/write LSB only, the most significant byte cannot be read. 6. N stands for an undefined count. 7. Vertical lines show transitions between count values. FIGURE 21. MODE 4
NOTES: 1. Counters are programmed for binary (not BCD) counting and for reading/writing least significant byte (LSB) only. 2. The Counter is always selected (CS always low). 3. CW stands for "Control Word"; CW = 10 means a Control Word of 10, Hex is written to the Counter. 4. LSB stands for "Least significant byte" of count. 5. Numbers below diagrams are count values. The lower number is the least significant byte. The upper number is the most significant byte. Since the Counter is programmed to read/write LSB only, the most significant byte cannot be read. 6. N stands for an undefined count. 7. Vertical lines show transitions between count values. FIGURE 22. MODE 5
Spec Number 965
518059
HS-82C54RH Operation Common to All Modes
Programming When a Control Word is written to a Counter, all Control Logic is immediately reset and OUT goes to a known initial state; no CLK pulses are required for this. Gate The GATE input is always sampled on the rising edge of CLK. In Modes 0, 2, 3 and 4 the GATE input is level sensitive, and logic level is sampled on the rising edge of CLK. In modes 1, 2, 3 and 5 the GATE input is rising-edge sensitive. In these Modes, a rising edge of Gate (trigger) sets an edge-sensitive flip-flop in the Counter. This flip-flop is then sampled on the next rising edge of CLK. The flip-flop is reset immediately after it is sampled. In this way, a trigger will be detected no matter when it occurs - a high logic level does not have to be maintained until the next rising edge of CLK. Note that in Modes 2 and 3, the GATE input is both edge-and level-sensitive. Counter New counts are loaded and Counters are decremented on the falling edge of CLK. The largest possible initial count is 0; this is equivalent to 216 for binary counting and 104 for BCD counting. The Counter does not stop when it reaches zero. In Modes 0, 1, 4 and 5 the Counter "wraps around" to the highest count, either FFFF hex for binary counting or 9999 for BCD counting, and continues counting. Modes 2 and 3 are periodic; the Counter reloads itself with the initial count and continues counting from there.
SIGNAL STATUS MODES 0 1 GATE PIN OPERATIONS SUMMARY LOW OR GOING LOW Disables counting -
RISING 1) Initiates counting 2) Resets output after next clock
HIGH Enables counting -
2
1) Disables counting Initiates counting 2) Sets output immediately high 1) Disables counting Initiates counting 2) Sets output immediately high 1) Disables counting Initiates counting
Enables counting Enables counting Enables counting -
3
4 5
MINIMUM AND MAXIMUM INITIAL COUNTS MODE 0 1 2 3 4 5 MIN COUNT 1 1 2 2 1 1 MAX COUNT 0 0 0 0 0 0
NOTE: 0 is equivalent to 216 for binary counting and 104 for BCD counting.
Spec Number 966
518059
HS-82C54RH Metallization Topology
DIE DIMENSIONS: 4700 x 5510m x 485m 25.4m METALLIZATION: Type: Al/Si Thickness: 11kA 2kA GLASSIVATION: Type: SiO2 Thickness: 8kA 1kA WORST CASE CURRENT DENSITY: 7.9 x 104 A/cm2
Metallization Mask Layout
HS-82C54RH
(24) VDD (23) WR (22) RD
(3) D5
(2) D6
(1) D7
(21) CS D4 (4)
(20) A1 D3 (5) (19) A0
D2 (6)
D1 (7)
(18) CLK 2
(17) OUT 2 D0 (8)
(16) GATE 2 CLK 0 (9) GATE 1 (14) OUT 0 (10) OUT 1 (13) GATE 0 (11) CLK 1 (15) VSS (12)
Spec Number 967
518059
HS-82C54RH
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Sales Office Headquarters
NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (407) 724-7000 FAX: (407) 724-7240 EUROPE Intersil SA Mercure Center 100, Rue de la Fusee 1130 Brussels, Belgium TEL: (32) 2.724.2111 FAX: (32) 2.724.22.05 ASIA Intersil (Taiwan) Ltd. Taiwan Limited 7F-6, No. 101 Fu Hsing North Road Taipei, Taiwan Republic of China TEL: (886) 2 2716 9310 FAX: (886) 2 2715 3029
Spec Number 968

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